Advanced semiconductor fabrication process control using...

Advanced semiconductor fabrication process control using dual filter exponentially weighted moving average

Hyo-Heon Ko, Jihyun Kim, Sang-Hoon Park, Jun-Geol Baek, Sung-Shick Kim
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Volume:
23
Language:
english
Pages:
13
DOI:
10.1007/s10845-010-0383-6
Date:
June, 2012
File:
PDF, 617 KB
english, 2012
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