Hydrogen depth profile in phosphorus-doped, oxygen-free...

Journal of Materials Science 2012 / 10 Vol. 47; Iss. 19

Hydrogen depth profile in phosphorus-doped, oxygen-free copper after cathodic charging

Martinsson, Åsa, Sandström, Rolf
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Volume:
47
Language:
english
Pages:
9
Journal:
Journal of Materials Science
DOI:
10.1007/s10853-012-6592-y
Date:
October, 2012
File:
PDF, 826 KB
english, 2012
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