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Thermally stimulated conductivity of Cu3BiS3thin films deposited by co-evaporation: determination of trap parameters related to defects in the gap
Dussan, A., Murillo, J. M., Mesa, F.Volume:
47
Language:
english
Pages:
5
Journal:
Journal of Materials Science
DOI:
10.1007/s10853-012-6610-0
Date:
September, 2012
File:
PDF, 322 KB
english, 2012