Preparation and characterisation of thickness dependent...

Journal of Materials Science: Materials in Electronics 2012 / 07 Vol. 23; Iss. 7

Preparation and characterisation of thickness dependent nano-structured ZnS thin films by sol–gel technique

Abdullah Goktas, Ferhat Aslan, Eyup Yasar, Ibrahim Halil Mutlu
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Volume:
23
Language:
english
Pages:
6
DOI:
10.1007/s10854-011-0599-z
Date:
July, 2012
File:
PDF, 371 KB
english, 2012
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