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On label dependence and loss minimization in multi-label classification
Dembczyński, Krzysztof, Waegeman, Willem, Cheng, Weiwei, Hüllermeier, EykeVolume:
88
Language:
english
Pages:
41
Journal:
Machine Learning
DOI:
10.1007/s10994-012-5285-8
Date:
July, 2012
File:
PDF, 1.39 MB
english, 2012