![](/img/cover-not-exists.png)
Microstructures and characteristics of deep trap levels in ZnO varistors doped with Y2O3
Jun Liu, Jun Hu, JinLiang He, YuanHua Lin, WangCheng LongVolume:
52
Language:
english
Pages:
6
DOI:
10.1007/s11431-009-0369-9
Date:
December, 2009
File:
PDF, 2.20 MB
english, 2009