Microstructures and characteristics of deep trap levels in...

Science China Technological Sciences 2009 / 12 Vol. 52; Iss. 12

Microstructures and characteristics of deep trap levels in ZnO varistors doped with Y2O3

Jun Liu, Jun Hu, JinLiang He, YuanHua Lin, WangCheng Long
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Volume:
52
Language:
english
Pages:
6
DOI:
10.1007/s11431-009-0369-9
Date:
December, 2009
File:
PDF, 2.20 MB
english, 2009
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