Pattern recognition of typical defects in high-voltage...

Science China Technological Sciences 2009 / 12 Vol. 52; Iss. 12

Pattern recognition of typical defects in high-voltage storage capacitors based on DC partial discharge

GuangNing Wu, ShanShan Bian, LiRen Zhou, XueQin Zhang, HanZheng Ran, ChengLong Yu
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Volume:
52
Language:
english
Pages:
7
DOI:
10.1007/s11431-009-0380-1
Date:
December, 2009
File:
PDF, 1.73 MB
english, 2009
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