Atom Probe Tomography of Zinc Oxide Nanowires

Journal of Electronic Materials 2012 / 05 Vol. 41; Iss. 5

Atom Probe Tomography of Zinc Oxide Nanowires

Nabil Dawahre, Gang Shen, Soner Balci, William Baughman, David S. Wilbert, Nick Harris, Lee Butler, Rich Martens, Seongsin Margaret Kim, Patrick Kung
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Volume:
41
Language:
english
Pages:
8
DOI:
10.1007/s11664-011-1803-x
Date:
May, 2012
File:
PDF, 1.09 MB
english, 2012
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