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Electrical transport properties of Ru/Cu/n-InP Schottky barrier diode based on temperature-dependentI–VandC–Vmeasurements
V. Lakshmi Devi, I. Jyothi, V. Rajagopal ReddyVolume:
86
Language:
english
Pages:
9
DOI:
10.1007/s12648-012-0118-y
Date:
August, 2012
File:
PDF, 723 KB
english, 2012