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Characterization of the interaction between rhodium and titanium oxide by XPS
Shu-Hua Chien, Boris N. Shelimov, Daniel E. Resasco, El Hang Lee, Gary L. HallerVolume:
77
Year:
1982
Language:
english
Pages:
3
DOI:
10.1016/0021-9517(82)90172-5
File:
PDF, 262 KB
english, 1982