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Migration of supported metals during preparation for electron microscopy
J.H. Onuferko, S.J. DeCanio, C. Dybowski, I.W. Hall, B.C. GatesVolume:
89
Year:
1984
Language:
english
Pages:
3
DOI:
10.1016/0021-9517(84)90335-x
File:
PDF, 381 KB
english, 1984