High temperature X-ray diffraction: An essential tool for phase diagram investigation. evidence of its role in the system Bi2O3-SrO
P. Conflant, M. Drache, J.P. Wignacourt, J.C. BoivinVolume:
26
Year:
1991
Language:
english
Pages:
8
DOI:
10.1016/0025-5408(91)90129-a
File:
PDF, 624 KB
english, 1991