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Design of exclusive or sum-of-products (ESP) logic arrays with universal tests for detecting stuck-at and bridging faults
Bhargab Bikram Bhattacharya, Bidyut Gupta, Satyabrata Sarkar, A.K. ChoudhuryVolume:
11
Year:
1984
Language:
english
Pages:
12
DOI:
10.1016/0045-7906(84)90018-1
File:
PDF, 833 KB
english, 1984