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Sensitivity-based optimization and statistical analysis of microwave semiconductor devices through multidimensional physical simulation (invited article)
Simona Donati, Fabrizio Bonani, Marco Pirola, Giovanni GhioneVolume:
7
Year:
1997
Language:
english
Pages:
15
DOI:
10.1002/(sici)1522-6301(199701)7:13.0.co;2-q
File:
PDF, 332 KB
english, 1997