Reliability of the ab initio potentials for simple van der...

Reliability of the ab initio potentials for simple van der Waals systems based on second virial and thermal diffusion coefficients

S. Tolosa, J.A. Sansón, F.J.Olivares del Valle
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Volume:
305
Year:
1994
Language:
english
Pages:
10
DOI:
10.1016/0166-1280(94)80142-8
File:
PDF, 838 KB
english, 1994
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