The suppression of residual defects in silicon implanted...

The suppression of residual defects in silicon implanted with arsenic by rapid isothermal annealing

C.M. Hasenack, J.P. De Souza, I.J.R. Baumvol
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
9
Year:
1985
Language:
english
Pages:
3
DOI:
10.1016/0168-583x(85)90761-x
File:
PDF, 341 KB
english, 1985
Conversion to is in progress
Conversion to is failed