Routine SIMS microanalysis: Trace Au and Pt in sulphides

Routine SIMS microanalysis: Trace Au and Pt in sulphides

N.M. Lindsay, J.P.F. Sellschop
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Volume:
35
Year:
1988
Language:
english
Pages:
6
DOI:
10.1016/0168-583x(88)90296-0
File:
PDF, 695 KB
english, 1988
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