Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
1989 Vol. 43; Iss. 4
Limits of depth resolution for sputter sectioning: A secondary ion mass spectrometry investigation of 63Ni in nickel
M.-P. Macht, R. Willecke, V. NaundorfVolume:
43
Year:
1989
Language:
english
Pages:
6
DOI:
10.1016/0168-583x(89)90398-4
File:
PDF, 873 KB
english, 1989