Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
1989 Vol. 44; Iss. 2
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Measurement of spectral and polarization characteristics of parametric X-rays in a Si crystal
Yu.N. Adishchev, V.A. Verzilov, A.P. Potylitsyn, S.R. Uglov, S.A. VorobyevVolume:
44
Year:
1989
Language:
english
Pages:
7
DOI:
10.1016/0168-583x(89)90417-5
File:
PDF, 690 KB
english, 1989