Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
1989 Vol. 42; Iss. 3
A new method (method of alpha parameters) for correcting PIXE measurements for matrix effects in infinitely thick samples
P. Aloupogiannis, G. Weber, J.P. Quisefit, J.M. Delbrouck, I. Roelandts, M.C. Rouelle, G. RobayeVolume:
42
Year:
1989
Language:
english
Pages:
10
DOI:
10.1016/0168-583x(89)90447-3
File:
PDF, 1.00 MB
english, 1989