Microhardness evaluation of cyclotron foil windows

Microhardness evaluation of cyclotron foil windows

R. Finn, T. Shives, C. Brady, P. Plascjak, W. Meyer Jr., Y. Sheh
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Volume:
40-41
Year:
1989
Language:
english
Pages:
3
DOI:
10.1016/0168-583x(89)90554-5
File:
PDF, 418 KB
english, 1989
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