Damage induced by high electronic stopping power in SiO2...

Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms 1990 Vol. 46; Iss. 1-4

Damage induced by high electronic stopping power in SiO2 quartz

M. Toulemonde, E. Balanzat, S. Bouffard, J.J. Grob, M. Hage-Ali, J.P. Stoquert
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Volume:
46
Year:
1990
Language:
english
Pages:
5
DOI:
10.1016/0168-583x(90)90670-p
File:
PDF, 430 KB
english, 1990
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