Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
1990 Vol. 45; Iss. 1-4
The use of helium ion RBS for profiling epitaxial layers of CdxHg1−xTe
A.J. Avery, D.J. Diskett, D.W. Lane, J. Giess, S.J.C. IrvineVolume:
45
Year:
1990
Language:
english
Pages:
5
DOI:
10.1016/0168-583x(90)90812-9
File:
PDF, 539 KB
english, 1990