Comparison between oxygen depth profiles in...

Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms 1990 Vol. 45; Iss. 1-4

Comparison between oxygen depth profiles in oxygen-implanted titanium measured by RBS and XPS combined with argon sputtering

Masaya Iwaki, Yoshio Okabe, Katsumasa Yabe
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
45
Year:
1990
Language:
english
Pages:
4
DOI:
10.1016/0168-583x(90)90819-g
File:
PDF, 441 KB
english, 1990
Conversion to is in progress
Conversion to is failed