Analysis of carbon at trace level by ion sputtering and...

Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms 1990 Vol. 45; Iss. 1-4

Analysis of carbon at trace level by ion sputtering and laser resonant postionization

P. Gelin, M.F. Barthe, J.L. Debrun, O. Gobert, T. Gibert, R.L. Inglebert, B. Dubreuil
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Volume:
45
Year:
1990
Language:
english
Pages:
2
DOI:
10.1016/0168-583x(90)90904-9
File:
PDF, 222 KB
english, 1990
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