Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
1990 Vol. 45; Iss. 1-4
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The analysis of semiconductor thin films with complementary Mössbauer scattering-RBS, channeling and nuclear reaction
F.C. Stedile, D.H. Mosca Jr., C.V.Barros Leite, F.L. Freire Jr., W.H. Schreiner, I.J.R. BaumvolVolume:
45
Year:
1990
Language:
english
Pages:
5
DOI:
10.1016/0168-583x(90)90914-g
File:
PDF, 665 KB
english, 1990