Measurement of the secondary emission yield of electrons...

Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms 1991 Vol. 61; Iss. 3

Measurement of the secondary emission yield of electrons from thin carbon foils after passage of low energy ions

John W. Keller, Keith W. Ogilvie, J.W. Boring, Robert W. McKemie
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Volume:
61
Year:
1991
Language:
english
Pages:
4
DOI:
10.1016/0168-583x(91)95632-n
File:
PDF, 428 KB
english, 1991
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