Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
1991 Vol. 59-60; Iss. part-P2
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Evaluation of electrical properties of vanadium suicide-silicon Schottky diodes formed by ion implantation
V.P. Salvi, A.M. Narsale, Subhaga Vidwans, A.A. Rangwala, B.M. Arora, Animesh K. Jain, KuldeepVolume:
59-60
Year:
1991
Language:
english
Pages:
5
DOI:
10.1016/0168-583x(91)95780-h
File:
PDF, 399 KB
english, 1991