Evaluation of electrical properties of vanadium...

Evaluation of electrical properties of vanadium suicide-silicon Schottky diodes formed by ion implantation

V.P. Salvi, A.M. Narsale, Subhaga Vidwans, A.A. Rangwala, B.M. Arora, Animesh K. Jain, Kuldeep
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Volume:
59-60
Year:
1991
Language:
english
Pages:
5
DOI:
10.1016/0168-583x(91)95780-h
File:
PDF, 399 KB
english, 1991
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