Microtopography and interface width of sputter profiled...

Microtopography and interface width of sputter profiled Cr/Ni multilayered thin-film materials

N. Tanović, L. Tanović, J. Fine, B. Gaković, P. Panjan, N. Popović
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Volume:
67
Year:
1992
Language:
english
Pages:
5
DOI:
10.1016/0168-583x(92)95879-v
File:
PDF, 383 KB
english, 1992
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