Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
1992 Vol. 67; Iss. 1-4
Microtopography and interface width of sputter profiled Cr/Ni multilayered thin-film materials
N. Tanović, L. Tanović, J. Fine, B. Gaković, P. Panjan, N. PopovićVolume:
67
Year:
1992
Language:
english
Pages:
5
DOI:
10.1016/0168-583x(92)95879-v
File:
PDF, 383 KB
english, 1992