Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
1992 Vol. 68; Iss. 1-4
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Film thickness determination with PIXE
C. Klatt, W. Ensinger, H. Martin, G.K. Wolf, P. Oberschachtsiek, D. Niemann, S. KalbitzerVolume:
68
Year:
1992
Language:
english
Pages:
4
DOI:
10.1016/0168-583x(92)96093-e
File:
PDF, 303 KB
english, 1992