Annealing behavior of damage in Si-implanted InP studied by...

Annealing behavior of damage in Si-implanted InP studied by piezoelectric detection of photoacoustic signal

Hiroshi Yoshinaga, Jun Kawai, Takaaki Agui, Fumiya Uehara, Tokue Matsumori
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Volume:
80-81
Year:
1993
Language:
english
Pages:
5
DOI:
10.1016/0168-583x(93)96188-i
File:
PDF, 372 KB
english, 1993
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