New results in soft X-ray microscopy

New results in soft X-ray microscopy

J. Kirz, H. Ade, E. Anderson, C. Buckley, H. Chapman, M. Howells, C. Jacobsen, C.-H. Ko, S. Lindaas, D. Sayre, S. Williams, S. Wirick, X. Zhang
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Volume:
87
Year:
1994
Language:
english
Pages:
6
DOI:
10.1016/0168-583x(94)95242-6
File:
PDF, 1.96 MB
english, 1994
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