Damage accumulation and amorphization in GaAs by MeV Si+...

Damage accumulation and amorphization in GaAs by MeV Si+ ion implantation at different tilt angles

Zhao Qing-tai, Wang Zhong-lie, Xu Tian-bing, Zhu Pei-ran, Zhou Jun-si
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Volume:
90
Year:
1994
Language:
english
Pages:
4
DOI:
10.1016/0168-583x(94)95584-0
File:
PDF, 481 KB
english, 1994
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