Identification of EOR defects due to the regrowth of...

Identification of EOR defects due to the regrowth of amorphous layers created by ion bombardment

B. de Mauduit, L. Laânab, C. Bergaud, M.M. Faye, A. Martinez, A. Claverie
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Volume:
84
Year:
1994
Language:
english
Pages:
5
DOI:
10.1016/0168-583x(94)95752-5
File:
PDF, 544 KB
english, 1994
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