Investigation of latent tracks from heavy ions in GeS...

Investigation of latent tracks from heavy ions in GeS crystals by high resolution TEM

J. Vetter, R. Scholz, N. Angert
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Volume:
91
Year:
1994
Language:
english
Pages:
5
DOI:
10.1016/0168-583x(94)96202-2
File:
PDF, 2.74 MB
english, 1994
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