Development of specimen holders for measuring electrical...

Development of specimen holders for measuring electrical properties of oxides under electron irradiation in HVEM

K. Shiiyama, C. Kinoshita, H. Suzuki, T. Izu, M. Kutsuwada, S. Matsumura
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Volume:
91
Year:
1994
Language:
english
Pages:
4
DOI:
10.1016/0168-583x(94)96232-4
File:
PDF, 364 KB
english, 1994
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