Composition analysis of NdxFeyB thin films by RBS and heavy...

Composition analysis of NdxFeyB thin films by RBS and heavy ion ERDA

R. Grötzschel, Michael Mäder, Ulrich Kreissig, Stephan Grigull, Walter Assmann, Stefan Parhofer
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Volume:
118
Year:
1996
Language:
english
Pages:
5
DOI:
10.1016/0168-583x(95)01202-8
File:
PDF, 459 KB
english, 1996
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