Scanning electron microscopy with polarization analysis...

Scanning electron microscopy with polarization analysis (SEMPA) — studies of domains, domain walls and magnetic singularities at surfaces and in thin films

M.R. Scheinfein, J. Unguris, M. Aeschlimann, D.T. Pierce, R.J. Celotta
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Volume:
93
Year:
1991
Language:
english
Pages:
7
DOI:
10.1016/0304-8853(91)90313-y
File:
PDF, 1.36 MB
english, 1991
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