The correlation between microstructure, chemical profile...

The correlation between microstructure, chemical profile and reflectivity changes in laser-irradiated Sb/Ge multilayer films

Amanda K. Petford-Long, N.J. Long, R. Serna, C.N. Afonso
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Volume:
126
Year:
1993
Language:
english
Pages:
3
DOI:
10.1016/0304-8853(93)90698-2
File:
PDF, 500 KB
english, 1993
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