Sample stacking in CZE using dynamic thermal junctions I....

ELECTROPHORESIS 2009 Vol. 30; Iss. 9

Sample stacking in CZE using dynamic thermal junctions I. Analytes with low dpKa/dT crossing a single thermally induced pH junction in a BGE with high dpH/dT

Marcos Mandaji, Gabriel Rübensam, Rodrigo Barcellos Hoff, Sandro Hillebrand, Emanuel Carrilho, Tarso Ledur Kist
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Volume:
30
Year:
2009
Language:
english
Pages:
9
DOI:
10.1002/elps.200800584
File:
PDF, 236 KB
english, 2009
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