Total-reflection X-ray diffractometry and its applications...

Total-reflection X-ray diffractometry and its applications to evaporated organic thin films

Toshihisa Horiuchi, Kazumi Matsushige
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
48
Year:
1993
Language:
english
Pages:
6
DOI:
10.1016/0584-8547(93)80017-o
File:
PDF, 334 KB
english, 1993
Conversion to is in progress
Conversion to is failed