Measurement of X-ray spectral line wavelengths by using two...

Journal of X-Ray Science and Technology 1990 Vol. 2; Iss. 2

Measurement of X-ray spectral line wavelengths by using two Bragg reflections

A.V. Rodé, A.M. Maksimchuk, G.V. Sklizkov, A. Ridgeley, C. Danson, N. Rizvi, R. Bann, E. Forster, K. Goetz, I. Uschmann
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Volume:
2
Year:
1990
Language:
english
Pages:
11
DOI:
10.1016/0895-3996(90)90007-9
File:
PDF, 488 KB
english, 1990
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