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Surface defects and accompanying imperfections in 4H–SiC: Optical, structural and electrical characterization
Bin Chen, Hirofumi Matsuhata, Takashi Sekiguchi, Kyouichi Ichinoseki, Hajime OkumuraVolume:
60
Year:
2012
Language:
english
Pages:
8
DOI:
10.1016/j.actamat.2011.09.010
File:
PDF, 1.28 MB
english, 2012