Sparsity reconstruction in electrical impedance tomography:...

Journal of Computational and Applied Mathematics 2012 Vol. 236; Iss. 8

Sparsity reconstruction in electrical impedance tomography: An experimental evaluation

Matthias Gehre, Tobias Kluth, Antti Lipponen, Bangti Jin, Aku Seppänen, Jari P. Kaipio, Peter Maass
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Volume:
236
Year:
2012
Language:
english
Pages:
11
DOI:
10.1016/j.cam.2011.09.035
File:
PDF, 1.02 MB
english, 2012
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