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Effect of W impurity on resistance switching characteristics of NiOx films
Jonggi Kim, Heedo Na, Sunghoon Lee, Yong-Hun Sung, Jung-Ho Yoo, Doo-Sung Lee, Dae-Hong Ko, Hyunchul SohnVolume:
11
Year:
2011
Language:
english
Pages:
1
DOI:
10.1016/j.cap.2010.11.126
File:
PDF, 779 KB
english, 2011