Charge loss in WSi2 nanocrystals nonvolatile memory with SiO2/Si3N4/SiO2 tunnel layer
Dong Uk Lee, Hyo Jun Lee, Eun Kyu Kim, Hee-Wook You, Won-Ju ChoVolume:
11
Year:
2011
Language:
english
Pages:
1
DOI:
10.1016/j.cap.2010.12.036
File:
PDF, 677 KB
english, 2011