Suppression of bias stress-induced degradation of...

Current Applied Physics 2012 Vol. 12; Iss. 1

Suppression of bias stress-induced degradation of pentacene-TFT using MoOx interlayer

Jun Li, Hua-Ping Lin, Fang Zhou, Wen-Qing Zhu, Xue-Yin Jiang, Zhi-Lin Zhang
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
12
Year:
2012
Language:
english
Pages:
4
DOI:
10.1016/j.cap.2011.06.020
File:
PDF, 506 KB
english, 2012
Conversion to is in progress
Conversion to is failed