Atomic force microscopy and Raman spectroscopy study of the...

Atomic force microscopy and Raman spectroscopy study of the early stages of carbon nanowall growth by dc plasma-enhanced chemical vapor deposition

Akihiko Yoshimura, Hirofumi Yoshimura, Seog Chul Shin, Ken-ichi Kobayashi, Makoto Tanimura, Masaru Tachibana
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Volume:
50
Year:
2012
Language:
english
Pages:
5
DOI:
10.1016/j.carbon.2012.02.026
File:
PDF, 772 KB
english, 2012
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