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Effects of tungsten thickness and annealing temperature on the electrical properties of W–TiO2 thin films
Chia-Ching Wu, Cheng-Fu Yang, Yuan-Tai Hsieh, Wen-Ray Chen, Chin-Guo Kuo, Hong-Hsin HuangVolume:
38
Year:
2012
Language:
english
Pages:
5
DOI:
10.1016/j.ceramint.2011.06.055
File:
PDF, 886 KB
english, 2012