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Computed tomography for dimensional metrology
J.P. Kruth, M. Bartscher, S. Carmignato, R. Schmitt, L. De Chiffre, A. WeckenmannVolume:
60
Year:
2011
Language:
english
Pages:
22
DOI:
10.1016/j.cirp.2011.05.006
File:
PDF, 3.59 MB
english, 2011